There are many design aspects that are evaluated early in project development to help foresee potential problems that may arise during test & balance (TAB). Many of these include, but are not limited ...
Ideally a test engineer would connect a separate instrument to each test point of a Device Undergoing Test (DUT), thereby providing the highest performance and most accurate measurements. But this is ...
Our second C-Brief discusses where system-level test (SLT) best fits into your semiconductor test workflow. With automated testing equipment (ATE), a traditional workflow may consist of: Wafer sort ...
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