Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

Researchers hunt for weaknesses in large node-based systems. U.S. government computer scientists are studying how computer grids react to volatile conditions to understand how events such as virus ...

In today’s world, so-called “high-performance, sustainable” facilities are a dime a dozen. But many of these buildings rely on overly complex mechanical systems to carry out their mission. While these ...

Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...

One of the great benefits of adopting the Lustre* parallel file system in any environment—HPC or enterprise—is that it’s an open source project with a deep and broad user community in front of it and ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...